ZX2
Stable, easy & affordable laser measurement sensor
High accuracy and measurement stability, at an affordable price. The new ZX2 laser sensor offers best in class performance for accuracy and speed for all linear displacement applications. Utilising an advanced HSDR-CMOS image sensor, high measurement stability is achieved, even on the most challenging of surfaces.
- One touch setup
- Accurate: 1.5–5 µm
- Any surface
- High speed: 30 µs
Specifications & ordering info
| Product | Geometrical resolution | Measuring range length | Relative linearity deflection | Output type | Sensing distance | Sensing distance (min.) | Sensing method | Spot size | Height of sensor | Width of sensor | Overall length of sensor | Description | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
0.005 mm | 65-135 mm | 0.1 % | 100 mm | 65 mm | Diffuse reflective | 0.1 mm | 47.5 mm | 22.6 mm | 35.5 mm | Laser displacement sensor, CMOS type, sensor head, spot beam type, 100mm +/-35mm, 5µm resolution, 0.5m cable |
|
|
|
|
0.005 mm | 65-135 mm | 0.05 % | 100 mm | 65 mm | Diffuse reflective | 2.7 mm x 0.1 mm | 47.5 mm | 22.6 mm | 35.5 mm | Laser displacement sensor, CMOS type, sensor head, line beam type, 100mm +/-35mm, 5µm resolution, 0.5m cable |
|
|
|
|
0.0015 mm | 40-60 mm | 0.1 % | 50 mm | 40 mm | Diffuse reflective | 60 µm | 47.5 mm | 22.6 mm | 35.5 mm | Laser displacement sensor, CMOS type, sensor head, spot beam type, 50mm +/-10mm, 1.5µm resolution, 0.5m cable |
|
|
|
|
0.0015 mm | 40-60 mm | 0.05 % | 50 mm | 40 mm | Diffuse reflective | 2.6 mm x 60 µm | 47.5 mm | 22.6 mm | 35.5 mm | Laser displacement sensor, CMOS type, sensor head, line beam type, 50mm +/-10mm, 1.5µm resolution, 0.5m cable |
|
|
|
|
0.0015 mm | 43-53 mm | 0.3 % | 48 mm | 43 mm | Background suppression | 60 µm | 47.5 mm | 22.6 mm | 35.5 mm | Laser displacement sensor head, 48 +/- 5mm, spot focus (requires amplifier), glass-mirror-wafer applications |
|
|
|
|
NPN | Amplifier | Laser displacement sensor, CMOS type, amplifier unit, NPN output, 2 m cable |
|
|||||||||
|
|
PNP | Amplifier | Laser displacement sensor, CMOS type, amplifier unit, PNP output |
|
How can we help you?
If you have a question or would like to ask for a quote, please contact us or send a request.
Ota minuun yhteyttä ZX2
Kiitos yhteydenotostasi. Otamme teihin yhteyttä mahdollisimman pian.
Meillä on teknisiä ongelmia. Emme ole pystyneet vastaanottamaan lomakettasi. Pahoittelemme ja pyydämme yrittämään uudelleen myöhemmin.
DownloadTarjous ZX2
Tällä lomakkeella voit pyytää tarjouksen valitsemastasi tuotteesta. Täytäthän kaikki *-merkityt kentät. Henkilökohtaisia tietojasi käsitellään luottamuksellisesti.
Kiitos tarjouspyynnöstä. Toimitamme tarvittavat tiedot teille mahdollisimman pian.
Meillä on teknisiä ongelmia. Emme ole pystyneet vastaanottamaan lomakettasi. Pahoittelemme ja pyydämme yrittämään uudelleen myöhemmin.
DownloadFeatures
HSDR-CMOS Image sensor
The ZX2 utilizes a newly developed High Speed & Dynamic Range (HSDR) CMOS image sensor. This provides stable measurement on surfaces ranging from highly absorbing to highly reflective, without loss of accuracy. The ZX2 continually monitors the received light level and adjusts the laser diode output to compensate, all in a cycle time of 60μs.
Easy Set-up
ZX2 Easy Set-up The ZX2 eliminates the need for complex set-up through lengthy parameter adjustment. A smart button is used to configure the sensor by defining the surface type for measurement.
- One type of surface
- Multiple surface types
- Highly reflective surfaces
Applications
Double sheet detection application
The high accuracy measurement and ability to cope with varying surface types, allows the ZX2 to be used for double sheet inspection.
Position reference application
Accurate linear measurements can be performed at high speed, allowing the ZX2 to be used for high speed position reference applications.
Thickness measurement application
Thickness measurement is made simple in the ZX2 via the calculation unit. Accurate thickness measurements can be achieved even on highly reflective surfaces.
Warpage measurement
Using multiple ZX2 units it is possible to inspect the warpage or deflection of components. Even where the temperature or measurement surface varies, stable measurements can still be achieved.
Downloads
